行业组件数据 · 2026

接触式探头

A precision contact probe used in coordinate measuring machines (CMMs) for dimensional inspection and quality control in manufacturing.

技术定义与适配语境
典型 接触式探头 会按材料、尺寸公差、适配关系和失效风险在 机械和设备制造 中评估。

A contact probe is a precision measurement component in coordinate measuring machines (CMMs) that physically touches the workpiece surface to collect dimensional data points. It consists of a stylus with a spherical tip, a probe head with deflection sensors, and a mounting interface. When the stylus contacts the workpiece, the probe detects deflection and triggers a measurement signal, recording the exact position in three-dimensional space for geometric dimensioning and tolerancing (GD&T) analysis.

组件规格

定义
A contact probe is a precision measurement component in coordinate measuring machines (CMMs) that physically touches the workpiece surface to collect dimensional data points. It consists of a stylus with a spherical tip, a probe head with deflection sensors, and a mounting interface. When the stylus contacts the workpiece, the probe detects deflection and triggers a measurement signal, recording the exact position in three-dimensional space for geometric dimensioning and tolerancing (GD&T) analysis.
工作原理
The contact probe operates on tactile sensing principles. When the stylus tip contacts a workpiece surface, it deflects slightly, triggering sensors (typically strain gauges or optical sensors) in the probe head. This deflection generates an electrical signal that indicates contact has been made. The CMM's controller records the machine's position at that moment, creating a precise 3D coordinate point. The probe can perform single-point measurements or scanning motions along surfaces.
材料
Stylus: Tungsten carbide or ceramic shaft with ruby (synthetic sapphire) spherical tip (typically 0.3mm to 8mm diameter). Probe body: Aluminum alloy or stainless steel with hardened steel components. Internal sensors: Strain gauges or optical elements with electronic circuits.
Repeatability
0.1μm to 0.5μm
Trigger Force
0.1N to 1.0N
Stylus Tip Diameter
0.3mm to 8mm
Connection Interface
M2, M3, or proprietary mounting systems
Operating Temperature
15°C to 30°C
Maximum Approach Speed
10mm/s to 50mm/s
Maximum Permissible Error (MPE)
±0.5μm to ±2.5μm
标准
ISO 10360ISO 15530DIN 32876VDI/VDE 2617

行业分类与别名

接触式探头 的常用贸易名称、技术标识和检索关键词。

上级产品

该组件会出现在以下整机或工业产品中。

FMEA · 风险与缓解

诱因 → 失效模式 → 工程缓解

Excessive approach speed or incorrect programming->Probe collision damaging stylus or internal components->Implement speed limits in CMM software, use protective covers, and conduct operator training on safe probing practices
Accumulation of contaminants on stylus tip->Measurement errors due to false triggering or offset->Regular cleaning with approved solvents, maintain clean measurement environment, implement daily verification procedures
Thermal expansion from temperature fluctuations->Dimensional measurement drift exceeding tolerance->Maintain stable temperature environment (20°C ±1°C), allow thermal stabilization time, use temperature compensation in CMM software

工业生态与工程逻辑

0
Stylus wear affecting measurement accuracy
1
Probe damage from collision or excessive force
2
Temperature variations causing thermal expansion errors
3
Contamination (dust, oil) on stylus tip
4
Electrical interference affecting signal transmission

合规与检测

tolerance
Maximum Permissible Error (MPE) as per ISO 10360-2: Typically ±(1.0 + L/350) μm where L is measurement length in mm
test method
Performance verification using reference artifacts (spheres, gauge blocks) according to ISO 10360 series standards. Daily calibration using master sphere with form error <0.1μm.

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制造商列表用于前期研究和供应商能力理解,不代表认证、排名或交易担保。

采购评估维度

不是客户评论,也不是实时热度。以下维度用于前期 RFQ 准备和供应商评估。

技术文档
4/5
制造能力
4/5
可检验性
5/5
供应商透明度
3/5

这些分值是采购评估维度示例,不代表真实客户评分、具体国家买家反馈或实时询盘。

相关组件

常见问题

What is the difference between a contact probe and a non-contact probe?

Contact probes physically touch the workpiece with a stylus, providing high accuracy for hard materials with defined surfaces. Non-contact probes (like laser or vision systems) measure without physical contact, suitable for delicate or soft materials but may have different accuracy characteristics.

How often should contact probes be calibrated?

Contact probes should be calibrated daily or before critical measurements using a reference sphere. Full performance verification should follow manufacturer recommendations, typically every 6-12 months or according to ISO 10360 standards.

Can contact probes measure soft or delicate materials?

Yes, with appropriate selection. Low-force probes (0.1N-0.3N) with larger tip diameters can minimize surface deformation. For very delicate materials, non-contact methods might be preferable to avoid any marking or damage.

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